摘要：闩锁效应是CMOS集成电路在实际应用中失效的主要原因之一，本文从CMOS集成电路工艺结构出发，详细地分析了闩锁效应的形成机理，并从版图和工艺设计两方面总结了几种抑制闩锁效应的关键技术。
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