摘要:研究了Cu/Sn3.0Ag0.5Cu/Cu钎焊焊点在多场(磁场、温度场、电流)作用下电迁移时阳极、阴极界面金属间化合物的生长行为。结果表明:随着时效时间的延长,阳极金属间界面化合物显著增加,阴极金属间界面化合物逐渐减少,且阳极界面化合物的厚度增加量远大于阴极界面化合物厚度的减少量,48 h时,在电流密度为0.8×10^4 A/cm^2下,阳极界面化合物厚度增加了8.8μm,阴极仅减少了0.39μm。
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