摘要：概述了2004年建立的非极性驻极体在室温下等温衰减的行为方程[1].将它与ECM常温下等温灵敏度衰减实验记录相结合,能较好地估算ECM的使用寿命及FEP的电阻率.
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Acta Mathematicae Applicatae Sinica Journal of Genetics and Genomics Acta Biochimica et Biophysica Sinica Journal of Systems Engineering and Electronics Chinese Annals of Mathematics Series B Chinese Annals of Mathematics,Series B Frontiers of Information Technology Electronic Engineering Transactions of Nonferrous Metals Society of China